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SPM Accessories → Calibration and Test Samples → 498-011-500

498-011-500

Calibration Artifact: 200nm Depth, 10μm Pitch, mounted on 18mm sample puck. Recommended for Innova and CP-II. shown without the 18mm sample puck.
The NanoDevices" SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes. NanoDevices" SPM calibration grating is a reference artifact, where the specifications are met through tight manufacturing tolerance and not by individual per die measurement.


APSH-0010

Model#	Instrument	Mount	Pack Size	Cost	Qty
498-011-500	CP		1	$610.00 (USD)

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