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DDESP-FM-10
A pack of Electrical Probes
Doped diamond coated conductive probes for electrical characterization and increased wear resistance (for non-conductive hardened probes, see DLC-coated Model #TESPD). Unmounted for all AFMs.
Quantity=10
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Tip SpecificationThe Doped Diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.
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| Geometry: |
Anisotropic |
| Tip Height (h): |
10 - 15µm
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| Front Angle (FA): |
25 ± 2.5° |
| Back Angle (BA): |
15 ± 2.5° |
| Side Angle (SA): |
22.5 ± 2.5°
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| Tip Radius (Nom): |
35nm |
| Tip Radius (Max): |
50nm |
| Tip SetBack (TSB)(Nom): |
15µm |
| Tip Set Back (TSB)(RNG): |
5 - 25µm |
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Cantilever Specification
The aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, highly reflective samples, and machine vision applications.
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Material:
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0.01-0.02 Ωcm Antimony (n) doped Si |
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Thickness (t)(Nom):
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3µm
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Thickness (t)(RNG):
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2.5µm - 3.5µm
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Front Side Coating:
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100nm of Doped Diamond |
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Back Side Coating:
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40 ± 10nm of Al |
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| Nom. |
Min. |
Max. |
| 225 |
200 |
250 |
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DDESP-FM-10
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Unmounted
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10
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$1,250.00 (USD)
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