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| 00-107-0141 |
| EFM Test Sample on 18mm Puck for Innova and CP/CP-II; This sample is c |
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| 10-10254-01 |
| NSOM sample standard for Aurora/Lumina. NSOM sample standard on 25mm x |
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| 498-011-500 |
| Calibration Artifact: 200nm Depth, 10μm Pitch, mounted on 18mm sample |
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| 7110-00 |
| Standard sample kit for all Veeco SPMs. This kit includes graphite sam |
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| APCS-0001 |
| Platinum-coated calibration grating for AFMs: 100nm Depth, 1µm Pi |
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| APCS-0099 |
| Multi-area Calibration artifact, pitch size is selectable from 2µ |
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| FSUB-11 |
| Amine functionalized silicon substrate for immobilizing biological mol |
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| HOPG |
| HOPG is often used as a standard testing sample for Scanning Tunn |
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| ISGS |
| This Gold Sample, mounted on 15mm Puck, is for indenting/scratching ap |
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| MFMSAMPLE |
| Magnetic Force Microscopy Sample, on 15mm Puck. |
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| MFMSAMPLE-CP |
| Magnetic Force Microscopy Sample, 18mm puck for Innova and CP-II SPMs. |
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| MICA |
| These sample disks are useful as a sample substrate (especially for bi |
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| PG |
| Calibration Artifact: 100nm Depth (+/- 10%), 1µm Pitch, Pt Coated |
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| PG-STM |
| Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated. This sam |
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| PS-LDPE |
Elastic modulus ~2GPa (PS) and ~0.1GPa (PE)
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| RS |
| Titanium Roughness Sample. This is used with the NanoScope tip-evaluat |
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| SCMSAMPLE |
| Scanning Capacitance Sample, on 15mm Puck. This sample shown domains w |
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| SCMSAMPLE-CP |
| Scanning Capacitance Sample, mounted on 18mm Puck for Innova/CP-II. Th |
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| SHS-200 |
| Calibration artifact: step height standard, on 12mm puck. This calibra |
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| SHSPT-200 |
| Calibration artifact: grating step height standard, Pt coated, on 12mm |
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