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| SCANASYST-AIR |
| Sharpened Silicon Tip; 1 Cantilever 0.2-0.8N/m; Au Reflective Coating< |
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| SCANASYST-FLUID |
| Sharpened Silicon Tip; 1 Cantilever 0.35-1.4N/m; Au Reflective Coating |
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| SCANASYST-FLUID+ |
| Sharpened Silicon Tip; 1 Cantilever 0.35-1.4N/m; Au Reflective Coating |
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| SCM-PIC |
| Conductive: 0.2N/m 13kHz, Pt/Ir Coating |
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| SCM-PICW |
| Conductive: 0.2N/m 13kHz, Pt/Ir Coating |
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| SCM-PIT |
| Conductive: 2.8N/m 75kHz, Pt/Ir Coating |
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| SCM-PITW |
| Conductive: 2.8N/m 75kHz, Pt/Ir Coating |
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| SCSI-COMT |
This is a direct replacement for the previous part #SCM-PITMT
High |
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| SNL-10 |
| Sharpened Silicon Tip; 4 Cantilevers 0.06-0.58N/m; Au Reflective Coati |
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| SNL-W |
| A full wafer of SNL probes, which marry the sharpness of a Silicon tip |
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| STM |
| 6mm cut Tungsten, 0.25mm diameter |
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| TESP |
| Sharp silicon probe, ideal for TappingMode and other modes of general |
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| TESPA |
| 42N/m, 320kHz, Al Reflective coating |
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| TESPA-HAR |
42N/m, 320kHz, High Aspect Ratio (5:1), Aluminum Coated
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| TESPAW |
| 42N/m, 320kHz, Al Reflective coating |
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| TESPD |
| 42N/m, 320kHz, DLC Coated tip |
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| TESPDW |
| 42N/m, 320kHz, DLC Coated tip |
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| TESP-HAR |
| 42N/m, 320kHz, High Aspect Ratio (5:1), No Coatings |
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| TESP-MT |
| Silicon TappingMode Probes, Mounted for use on Veeco Caliber and Explo |
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