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| APCC-0001 |
| The Unmounted Chip Carrier Toolkit, for Innova/CP-II, provides the har |
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| APCS-0001 |
| Platinum-coated calibration grating for AFMs: 100nm Depth, 1µm Pi |
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| APCS-0099 |
| Multi-area Calibration artifact, pitch size is selectable from 2µ |
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| APMC-0001 |
| Microcell for Innova and CP-II. This cell is for liquid imaging in con |
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| APSH-0010 |
| SPM Sample Mounting Disk, 18mm diameter for Innova and CP-II SPMs. One |
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| APSH-0020 |
| Non-Magnetic Sample Holder, Innova and CP-II. The non-magnetic sample |
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| APSH-0040 |
| The Cross-Sectional Sample Holder, 0.75" in diameter and 0.26" ta |
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| APSH-0050 |
| Sample bias holder for Innova/CP-II has connectors to apply an externa |
|
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| DMFM-START |
| MFM starter kit for Dimension series SPMs. This MFM starter kit contai |
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| HOPG |
| HOPG is often used as a standard testing sample for Scanning Tunn |
|
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| ISGS |
| This Gold Sample, mounted on 15mm Puck, is for indenting/scratching ap |
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| MFMSAMPLE |
| Magnetic Force Microscopy Sample, on 15mm Puck. |
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| MFMSAMPLE-CP |
| Magnetic Force Microscopy Sample, 18mm puck for Innova and CP-II SPMs. |
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| MICA |
| These sample disks are useful as a sample substrate (especially for bi |
|
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| MMMFM-START |
| This MFM starter kit contains all the accessories necessary for perfor |
|
 |
| PG |
| Calibration Artifact: 100nm Depth (+/- 10%), 1µm Pitch, Pt Coated |
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| PG-STM |
| Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated. This sam |
|
 |
| PSH-103 |
| Micro-vise sample holder for polymer & other soft materials. This |
|
 |
| RS |
| Titanium Roughness Sample. This is used with the NanoScope tip-evaluat |
|
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| SCMSAMPLE |
| Scanning Capacitance Sample, on 15mm Puck. This sample shown domains w |
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