 |
| 00-10043 |
| Alignment stand and cable interface, CP-II 100μm scanner. The closed-l |
|
 |
| 00-10174 |
| Chip carrier with lead and BNC connector, Innova/CP-II. The unmounted |
|
 |
| 00-107-0091 |
| Chip carrier for unmounted cantilevers for Innova/CP-II SPMs; The unmo |
|
 |
| 00-107-0141 |
| EFM Test Sample on 18mm Puck for Innova and CP/CP-II; This sample is c |
|
 |
| 00-107-0142 |
| Chip carrier with lead, Innova/CP-II; The unmounted probe chip carrier |
|
 |
| 00-109-0081 |
| Innova/CP-II Cantilever/Sample Assortment; Kit includes: 3 of MPP-1112 |
|
 |
| 1550-00 |
| Cantilever & wafer tool kit for all Veeco SPMs: 1 scribe, 1 wafer |
|
 |
| 498-011-500 |
| Calibration Artifact: 200nm Depth, 10μm Pitch, mounted on 18mm sample |
|
 |
| APCC-0001 |
| The Unmounted Chip Carrier Toolkit, for Innova/CP-II, provides the har |
|
 |
| APCS-0001 |
| Platinum-coated calibration grating for AFMs: 100nm Depth, 1µm Pi |
|
 |
| APCS-0099 |
| Multi-area Calibration artifact, pitch size is selectable from 2µ |
|
 |
| APMC-0001 |
| Microcell for Innova and CP-II. This cell is for liquid imaging in con |
|
 |
| APSH-0010 |
| SPM Sample Mounting Disk, 18mm diameter for Innova and CP-II SPMs. One |
|
 |
| APSH-0020 |
| Non-Magnetic Sample Holder, Innova and CP-II. The non-magnetic sample |
|
 |
| APSH-0040 |
| The Cross-Sectional Sample Holder, 0.75" in diameter and 0.26" ta |
|
 |
| APSH-0050 |
| Sample bias holder for Innova/CP-II has connectors to apply an externa |
|
 |
| MFMSAMPLE-CP |
| Magnetic Force Microscopy Sample, 18mm puck for Innova and CP-II SPMs. |
|
|
| PFM-SMPL |
| Standard sample for Piezoresponse Force Microscopy. Square substrate o |
|
 |
| PSH-103 |
| Micro-vise sample holder for polymer & other soft materials. This |
|
 |
| PSIT-0005 |
| MFM Toolkit for the Innova/CP-II SPM. Magnetic Force Microscopy (MFM) |
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